NIFS-DATA-057

FULL TEXT (PDF, 354 KB)


Author(s):

T. Ono, T. Kawamura, T. Kenmotsu, Y. Yamamura

Title:

Simulation Study on Retention and Reflection from Tungsten Carbide under High Fluence of Helium Ions

Date of publication:

Aug. 2000

Key words:

retention, irradiation-dependent diffusion coefficient, reflection, helium, tungsten carbide, Monte Carlo simulation

Abstract:

We have studied, by a Monte Carlo simulation code ACAT-DIFFUSE, the fluence-dependence of the amount of retained helium atoms in tungsten carbide at room temperature under helium ion bombardment. The retention behavior may be understood qualitatively in terms of irradiation-dependent diffusion coefficient assumed and range. The emission processes from tungsten carbide under helium ion irradiation derived were compared with each other. We have discussed the retention curves for incident energy of 5 keV at incident angles of 0 degree and 80 degree and of 500 eV at 0 degree .The energy spectra of helium atoms reflected from tungsten carbide for incident energy of 500 eV at 0 degree and 80degree were compared with those from graphite and tungsten.

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