NIFS-203

FULL TEXT (PDF, 845 KB)

Author(s):

Y. Hamada, Y. Kawasumi, H. Iguchi, A. Fujisawa, Y. Abe and M. Takahashi

Title:

Mesh Effect in a Parallel Plate Analyzer

Date of publication:

Dec. 1992

Key words:

analyzer, mesh, deflection, HIBP, focus

Abstract:

The effect of field irregularity due to meshes on the holes of a lower electrode in a parallel-plate electrostatic analyzer for beam penetration, is experimentally and numerically investigated. Displacement of a focal point and degradation of analyzer characteristics are found in the experiment. They are also confirmed by numerical analysis. Criteria for the error estimation are theoretically derived and found to be consistent with the experiment

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