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Author(s):
J. Uramoto
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Title:
A Research of Possibility for Negative Muon Production by a Low Energy Electron Beam Accompanying Ion Beam
Date of publication:
Dec. 1993
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Key words:
negative muonlike particle, bunched beam electron, positive ion beam
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Abstract:
A low energy electron beam (leq 2000 eV) is injected perpendicularly to a uniform magnetic field, together with a low energy positive ion beam.. On this magnetic mass analysis (using the uniform magnetic field), a peak of secondary electron current to the beam collector (arranging as a mass analyzer of 90 degrees type), appears at an analyzing magnetic field which corresponds exactly to a relation of negative muon mu^- ( the mass m = 207 m_e and the charge q = e, where m_e and e are mass and charge of electron). The ion beam is essential for the peak appearance, which is produced by decelerating electrically the electron beam in front of the entrance slit of the mass analyzer, and by introducing a neutral gas into the electron beam region and producing a plasma through the ionization. We consider that a very small amount of negative muons may be produced through local cyclotron motions of the injected beam electrons in the ion beam or by an interaction between the bunched beam electrons and beam ions.
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