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Author(s):
A. Fujisawa, H. Iguchi, S. Lee and Y. Hamada
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Title:
Consideration of Fluctuation in Secondary Beam Intensity of Heavy Ion Beam Prove Measurements
Date of publication:
Jan. 1997
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Key words:
Heavy lon Beam Probe, Path Integral Effect, Density Fluctuation, Temperature Fluctuation, Contamination
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Abstract:
Heavy ion beam probes have capability to detect local electron density fluctuation in the interior of plasmas through the detected beam intensity fluctuation. However, the intensity fluctuation should suffer a certain degree of distortion from electron density and temperature fluctuations on the beam orbits, and as a result the signal can be quite different from the local density fluctuation. This paper will present a condition that the intensity fluctuation can be regarded as being purely local electron density fluctuation, together with discussion about the contamination of the fluctuation along the beam orbits to the beam intensity fluctuation.
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