NIFS-543

FULL TEXT (PDF, 578 KB)


Author(s):

J. Uramoto

Title:

Some Problems inside a Mass Analyzer for Pions Extracted from a H_2 Gas Discharge

Date of publication:

Mar. 1998

Key words:

pion, mu-neutrino, back metal plate, positive ion

Abstract:

When positive or negative pions are extracted with (H^+, H_2^+, H_3^+) ions or H^- ions and enter a magnetic mass analyzer MA of 90degree deflection type, some problems occur, which are very different from mass analyses of classical charged particles. Because the pions can penetrate indirectly metal plates (which include a beam collector itself of MA) while mu-neutrino nu_mu and anti-mu-neutrino bar{nu}_mu beams generate. This phenomenon becomes serious when (H^+, H_2^+. H_3^+) ions or H^- ions are reflected by a back metal lid plate of MA and are supplied around the beam collector.

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