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Author(s):
J. Uramoto
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Title:
Simplified nu_mu, bar{nu}_mu Beam Detector and nu_mu, bar{nu}_mu Beam Source by Interaction between an Electron Bunch and a Positive Ion Bunch
Date of publication:
Mar. 1998
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Key words:
negative muonlike particles mu^-, positive muonlike particles mu^+ mu neutrinos nu_mu and anti-mu neutrinos bar{nu}_mu
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Abstract:
Both positive pionlike (pi^+) and negative pionlike (pi^-) particles are created by interaction between an electron bunch and a positive ion bunch which are produced from a low energy ( l KeV) electron beam, a neutral gas and a perpendicular uniform magnetic field. These pionlike particles are shot into a thick metal plate MP. When positive ions (above a critical ion energy) are supplied in the opposite side of MP, some negative muonlike particles mu^- appear continuously. Similarly, when electrons (above a critical electron energy) are supplied in the opposite side of MP, some positive muonlike particles mu^+ appear continuously. From the thickness of MP, unknown particles penetrating MP are estimated to be mu neutrinos nu_mu and anti-mu neutrinos bar{nu}_mu. These nu_mu and bar{nu}_mu sources are very simple as an experimental apparatus and can be developed much more in comparison with those from the H_2 gas discharge.
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