X-ray Spectral Analysis on Electron Interaction with Highly-Charged Ions in Tokyo-EBIT
D. Kato, N. Nakamura1), and S. Ohtani1)
National Institute for Fusion Science, Toki, Gifu 509-5292, Japan
Electron collision with highly charged ions (HCIs) is an important process to be studied for diagnostics of extreme plasma conditions at nuclear fusion devises and astronomical objects (e.g. super nova remnant). Electron-Beam-Ion-Trap (EBIT) [1] is a unique device which enables us the precise study of the high energy electron interaction with cold trapped HCIs. In the EBIT, the HCIs are excited by impact of high energy electron, and subsequently decay radiating photons. The photon emission spectra manifest relativistic atomic structures and radiative properties of the HCIs, as well as dynamical behavior in the interaction with electrons.
References
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[2]N. Nakamura et al., Rev. Sci. Instrum. 69 (1998) 694 [3]N. Nakamura, Rev. Sci. Instrum. 71 (2000) 4065 [4]B. M. Penetrante et al., Phys. Rev. A 43 (1991) 4861 [5]A. Bar-Shalom et al., “The HULLAC Package Computer Set of Codes for Atomic Structure and Processes in Plasmas” (unpublished)
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